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Peter Simon wrote: > > I am very interested in predicting the RF reflection and transmission > (at a frequency of 2.6 GHz) through a thin layer of Molybdenum (Mo) > that may be sputtered onto a 2 mil plastic substrate. The Mo > sputtering process will be very slow: over a cumulative time span of > several thousand hours the thickness will build up to as much as 500 > Angstrom. I'm interested in looking at the RF properties as a > function of the thickness of the layer from 0 to 500 Angstrom, and as > a function of temperature from 90 to 400 K. > > I know how to do the calculation given the value of the conductivity > of Mo: for a thin layer of good conductor the metal can be modeled as > a sheet resistance R = 1/(sigma*t), where sigma is the conductivity > and t is the thickness. For a thicker layer one can use a more > rigorous transmission line analogy. However, from browsing the > literature, I've seen that the effective conductivity depends on > several factors, including temperature, film thickness, and the manner > in which the Mo is arranged: single crystal, polycrystalline, or > amorphous. > > This deposition is going to occur in a vacuum, due to ion bombardment > of a molybdenum surface, at temperatures that vary over the range of > 90 to 400 K. [snip] Are you interested in the amount of Mo deposited and then RF properties, or something else? Why not have a naked quartz oscillator crystal in there and track the change of resonant frequency with increasing mass? It's a commercial system. Do your RF measurements concurrently, already knowing the film thickness to excellent accuracy Google quartz "deposition monitor" 172 hits "deposition monitor" 416 hits The only no-no is that quartz undergoes a solid state twinning transition at 573 C. Don't go above 500 C at the crystal. -- Uncle Al http://www.mazepath.com/uncleal/qz.pdf http://www.mazepath.com/uncleal/eotvos.htm (Do something naughty to physics)
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