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"Uncle Al" <[EMAIL PROTECTED]> wrote in message news:[EMAIL PROTECTED] > Peter Simon wrote: > > > > I am very interested in predicting the RF reflection and transmission > > (at a frequency of 2.6 GHz) through a thin layer of Molybdenum (Mo) > > that may be sputtered onto a 2 mil plastic substrate. [snip] > > Are you interested in the amount of Mo deposited and then RF > properties, or something else? Why not have a naked quartz oscillator > crystal in there and track the change of resonant frequency with > increasing mass? It's a commercial system. Do your RF measurements > concurrently, already knowing the film thickness to excellent accuracy > [snip] > The only no-no is that quartz undergoes a solid state twinning > transition at 573 C. Don't go above 500 C at the crystal. > > -- > Uncle Al I don't wish to measure the amount of Mo deposited. I am attempting to predict the amount of RF performance degradation to expect over the life of a spacecraft mission due to undesired Mo sputtering. My calculations will help to determine the maximum tolerable Mo layer thickness, and will be used as inputs into the decision as to what, if anything, needs to be done about the undesired sputtering. Thanks, Peter
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